Travelled to:
1 × USA
3 × Germany
4 × France
Collaborated with:
M.Favalli L.Benini C.Metra A.Acquaviva A.Bogliolo L.Schiano M.Dalpasso P.Olivo M.Sama V.Pacella E.Farella C.Stagni C.Guiducci M.Lanzoni
Talks about:
power (4) line (3) low (3) test (2) cmos (2) multimedia (1) intermedi (1) algorithm (1) electron (1) diagnosi (1)
Person: Bruno Riccò
DBLP: Ricc=ograve=:Bruno
Contributed to:
Wrote 8 papers:
- DATE-DF-2006-SamaPFBR #3d #low cost #named #power management
- 3dID: a low-power, low-cost hand motion capture device (MS, VP, EF, LB, BR), pp. 136–141.
- DATE-2005-StagniGLBR #design #detection
- Hardware-Software Design of a Smart Sensor for Fully-Electronic DNA Hybridization Detection (CS, CG, ML, LB, BR), pp. 198–203.
- DATE-2002-MetraSRF #online #power management #self #testing
- Self-Checking Scheme for the On-Line Testing of Power Supply Noise (CM, LS, BR, MF), pp. 832–836.
- DATE-2001-AcquavivaBR #adaptation #algorithm #multi #power management #streaming
- An adaptive algorithm for low-power streaming multimedia processing (AA, LB, BR), pp. 273–279.
- DATE-2000-MetraFR #online #testing
- On-Line Testing and Diagnosis of Bus Lines with respect to Intermediate Voltage Values (CM, MF, BR), p. 763.
- DATE-1998-MetraFR
- Highly Testable and Compact 1-out-of-n Code Checker with Single Output (CM, MF, BR), pp. 981–982.
- DAC-1996-BoglioloBR #estimation
- Power Estimation of Cell-Based CMOS Circuits (AB, LB, BR), pp. 433–438.
- EDAC-1994-FavalliDOR #fault #modelling
- Modeling of Broken Connections Faults in CMOS ICs (MF, MD, PO, BR), pp. 159–164.