Travelled to:1 × Germany
2 × USA
Collaborated with:U.Schlichtmann P.R.Maier H.E.Graeb J.A.Abraham A.Evans C.Gimmler-Dumont M.Glaß A.Herkersdorf S.R.Nassif N.Wehn
Talks about:technolog (3) awar (2) workload (1) standard (1) instruct (1) abstract (1) reliabl (1) product (1) predict (1) perform (1)
Person: Veit Kleeberger
DBLP: Kleeberger:Veit
Contributed to:
2014
20142013Wrote 3 papers:
- DAC-2014-KleebergerMS #analysis
- Workload- and Instruction-Aware Timing Analysis: The missing Link between Technology and System-level Resilience (VK, PRM, US), p. 6.
- DATE-2014-SchlichtmannKAEGGHNW #abstraction #design
- Connecting different worlds — Technology abstraction for reliability-aware design and Test (US, VK, JAA, AE, CGD, MG, AH, SRN, NW), pp. 1–8.
- DAC-2013-KleebergerGS #evaluation #modelling #performance #predict #standard
- Predicting future product performance: modeling and evaluation of standard cells in FinFET technologies (VK, HEG, US), p. 6.