Travelled to:1 × France
1 × Germany
1 × USA
Collaborated with:S.Pontarelli M.Ottavi S.Wen M.Ebrahimi M.B.Tahoori R.Seyyedi E.Costenaro D.Alexandrescu A.Silburt G.Vrckovnik T.Brown M.Dufresne G.Hall T.Ho Y.Liu U.Schlichtmann V.Kleeberger J.A.Abraham C.Gimmler-Dumont M.Glaß A.Herkersdorf S.R.Nassif N.Wehn
Talks about:error (2) comprehens (1) technolog (1) processor (1) nanoscal (1) function (1) abstract (1) ternari (1) reliabl (1) particl (1)
Person: Adrian Evans
DBLP: Evans:Adrian
Contributed to:
20142013
1998Wrote 4 papers:
- DATE-2014-EbrahimiETSCA #analysis #embedded #fault
- Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales (ME, AE, MBT, RS, EC, DA), pp. 1–6.
- DATE-2014-SchlichtmannKAEGGHNW #abstraction #design
- Connecting different worlds — Technology abstraction for reliability-aware design and Test (US, VK, JAA, AE, CGD, MG, AH, SRN, NW), pp. 1–8.
- DATE-2013-PontarelliOEW #detection #fault #using
- Error detection in ternary CAMs using bloom filters (SP, MO, AE, SJW), pp. 1474–1479.
- DAC-1998-EvansSVBDHHL #functional #scalability #verification
- Functional Verification of Large ASICs (AE, AS, GV, TB, MD, GH, TH, YL), pp. 650–655.