Travelled to:1 × Germany
1 × USA
Collaborated with:N.S.Nagaraj H.Haznedar D.Young L.Ye F.Chang P.Feldmann R.Chadha N.Ns
Talks about:electromigr (1) submicron (1) approach (1) practic (1) parasit (1) analysi (1) static (1) signal (1) effect (1) design (1)
Person: Frank Cano
DBLP: Cano:Frank
Contributed to:
1999
1998Wrote 2 papers:
- DATE-1999-YeCFCNC #design #verification
- Chip-Level Verification for Parasitic Coupling Effects in Deep-Submicron Digital Designs (LY, FCC, PF, RC, NN, FC), pp. 658–663.
- DAC-1998-NagarajCHY #analysis #approach
- A Practical Approach to Static Signal Electromigration Analysis (NSN, FC, HH, DY), pp. 572–577.