Travelled to:
1 × France
1 × Poland
2 × Germany
2 × United Kingdom
3 × USA
Collaborated with:
M.T.Kandemir M.Karaköy Ö.Özturk F.Li U.Sezer R.R.Brooks M.J.Irwin J.Ramanujam G.Chen
Talks about:
memori (4) base (4) approach (3) process (3) optim (3) code (3) constraint (2) schedul (2) network (2) address (2)
Person: Guilin Chen
DBLP: Chen:Guilin
Contributed to:
Wrote 11 papers:
- CGO-2007-OzturkCKK #latency #problem
- Compiler-Directed Variable Latency Aware SPM Management to CopeWith Timing Problems (ÖÖ, GC, MTK, MK), pp. 232–243.
- DAC-2006-OzturkCK #approach #constraints #network #optimisation #parallel
- Optimizing code parallelization through a constraint network based approach (ÖÖ, GC, MTK), pp. 863–688.
- DATE-2006-ChenOKK #array #data access #memory management
- Dynamic scratch-pad memory management for irregular array access patterns (GC, ÖÖ, MTK, MK), pp. 931–936.
- CC-2005-LiCKB #approach #security
- A Compiler-Based Approach to Data Security (FL, GC, MTK, RRB), pp. 188–203.
- CGO-2005-ChenK #code generation #optimisation
- Optimizing Address Code Generation for Array-Intensive DSP Applications (GC, MTK), pp. 141–152.
- DATE-2005-ChenKK #approach #constraints #layout #memory management #network #optimisation
- A Constraint Network Based Approach to Memory Layout Optimization (GC, MTK, MK), pp. 1156–1161.
- DATE-2005-KandemirC #embedded #process #scheduling
- Locality-Aware Process Scheduling for Embedded MPSoCs (MTK, GC), pp. 870–875.
- DATE-2005-KandemirLCCO #embedded #in memory #trade-off
- Studying Storage-Recomputation Tradeoffs in Memory-Constrained Embedded Processing (MTK, FL, GC, GC, ÖÖ), pp. 1026–1031.
- SAS-2005-ChenKK #execution #memory management #reliability
- Memory Space Conscious Loop Iteration Duplication for Reliable Execution (GC, MTK, MK), pp. 52–69.
- DATE-v1-2004-ChenKS #process #scheduling
- Configuration-Sensitive Process Scheduling for FPGA-Based Computing Platforms (GC, MTK, US), pp. 486–493.
- CC-2003-KandemirICR
- Address Register Assignment for Reducing Code Size (MTK, MJI, GC, JR), pp. 273–289.