Travelled to:
4 × USA
Collaborated with:
X.Li S.R.Nassif S.S.Sapatnekar X.Liu S.Sun P.Zhou H.Zhou C.Cher E.Kursun S.Yao H.Xiang C.Zhou Y.Lin F.Yee A.Sullivan P.Lu T.Jin Q.Wang L.Xu C.Pan L.Dou L.H.0001 T.Xie
Talks about:
generat (3) placement (2) sensor (2) full (2) chip (2) fin (2) temperatur (1) methodolog (1) framework (1) thermal (1)
Person: Haifeng Qian
DBLP: Qian:Haifeng
Contributed to:
Wrote 5 papers:
- DAC-2015-LiuSZLQ #generative #statistics
- A statistical methodology for noise sensor placement and full-chip voltage map generation (XL, SS, PZ, XL, HQ), p. 6.
- DAC-2014-XiangQZLYSL #generative
- Row Based Dual-VDD Island Generation and Placement (HX, HQ, CZ, YSL, FY, AS, PFL), p. 6.
- DAC-2012-ZhouLCKQY #framework #monitoring
- An information-theoretic framework for optimal temperature sensor allocation and full-chip thermal monitoring (HZ, XL, CYC, EK, HQ, SCY), pp. 642–647.
- DAC-2003-QianNS #network #random
- Random walks in a supply network (HQ, SRN, SSS), pp. 93–98.
- ESEC-FSE-2019-JinWXPDQ0X #generative #named #testing
- FinExpert: domain-specific test generation for FinTech systems (TJ, QW, LX, CP, LD, HQ, LH0, TX), pp. 853–862.