Travelled to:
1 × Germany
2 × USA
Collaborated with:
Y.Cao R.LiVolsi M.Torres S.Chellappa J.Ni X.Yao N.D.Hindman M.Chen L.T.Clark E.Mintarno J.Skaf R.Zheng S.P.Boyd R.W.Dutton S.Mitra
Talks about:
circuit (2) transient (1) character (1) variabl (1) extract (1) sensit (1) design (1) singl (1) scale (1) optim (1)
Person: Jyothi Velamala
DBLP: Velamala:Jyothi
Contributed to:
Wrote 3 papers:
- DAC-2011-VelamalaLTC #design #logic
- Design sensitivity of single event transients in scaled logic circuits (JV, RL, MT, YC), pp. 694–699.
- DAC-2010-ChellappaNYHVCCC #variability
- In-situ characterization and extraction of SRAM variability (SC, JN, XY, NDH, JV, MC, YC, LTC), pp. 711–716.
- DATE-2010-MintarnoSZVCBDM #self
- Optimized self-tuning for circuit aging (EM, JS, RZ, JV, YC, SPB, RWD, SM), pp. 586–591.