Design for test and reliability in ultimate CMOS
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Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky
Design for test and reliability in ultimate CMOS
DATE, 2012.

DATE 2012
Full names Links ISxN
	acmid         = "2492878",
	author        = "Michael Nicolaidis and Lorena Anghel and Nacer-Eddine Zergainoh and Yervant Zorian and Tanay Karnik and Keith A. Bowman and James Tschanz and Shih-Lien Lu and Carlos Tokunaga and Arijit Raychowdhury and Muhammad M. Khellah and Jaydeep Kulkarni and Vivek De and Dimiter Avresky",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "677--682",
	publisher     = "{IEEE}",
	title         = "{Design for test and reliability in ultimate CMOS}",
	year          = 2012,


Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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