Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky
Design for test and reliability in ultimate CMOS
DATE, 2012.
@inproceedings{DATE-2012-NicolaidisAZZKBTLTRKKDA,
acmid = "2492878",
author = "Michael Nicolaidis and Lorena Anghel and Nacer-Eddine Zergainoh and Yervant Zorian and Tanay Karnik and Keith A. Bowman and James Tschanz and Shih-Lien Lu and Carlos Tokunaga and Arijit Raychowdhury and Muhammad M. Khellah and Jaydeep Kulkarni and Vivek De and Dimiter Avresky",
booktitle = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-1-4577-2145-8",
pages = "677--682",
publisher = "{IEEE}",
title = "{Design for test and reliability in ultimate CMOS}",
year = 2012,
}
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