Travelled to:1 × Germany
3 × USA
Collaborated with:J.Tschanz V.De T.Karnik S.Lu S.M.Burns M.Ketkar N.Menezes C.Wilkerson S.Y.Borkar M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian C.Tokunaga A.Raychowdhury M.M.Khellah J.Kulkarni D.Avresky
Talks about:techniqu (3) circuit (3) variat (2) design (2) toler (2) statist (1) reliabl (1) convent (1) analysi (1) compar (1)
Person: Keith A. Bowman
DBLP: Bowman:Keith_A=
Contributed to:
2012
200920072005Wrote 4 papers:
- DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
- Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
- DAC-2009-BowmanTWLKDB
- Circuit techniques for dynamic variation tolerance (KAB, JT, CW, SLL, TK, VD, SYB), pp. 4–7.
- DAC-2007-BurnsKMBTD #analysis #comparative #design #statistics
- Comparative Analysis of Conventional and Statistical Design Techniques (SMB, MK, NM, KAB, JT, VD), pp. 238–243.
- DAC-2005-TschanzBD
- Variation-tolerant circuits: circuit solutions and techniques (JT, KAB, VD), pp. 762–763.