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Travelled to:
1 × Germany
3 × USA
Collaborated with:
J.Tschanz V.De T.Karnik S.Lu S.M.Burns M.Ketkar N.Menezes C.Wilkerson S.Y.Borkar M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian C.Tokunaga A.Raychowdhury M.M.Khellah J.Kulkarni D.Avresky
Talks about:
techniqu (3) circuit (3) variat (2) design (2) toler (2) statist (1) reliabl (1) convent (1) analysi (1) compar (1)

Person: Keith A. Bowman

DBLP DBLP: Bowman:Keith_A=

Contributed to:

DATE 20122012
DAC 20092009
DAC 20072007
DAC 20052005

Wrote 4 papers:

DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
Circuit techniques for dynamic variation tolerance (KAB, JT, CW, SLL, TK, VD, SYB), pp. 4–7.
DAC-2007-BurnsKMBTD #analysis #comparative #design #statistics
Comparative Analysis of Conventional and Statistical Design Techniques (SMB, MK, NM, KAB, JT, VD), pp. 238–243.
Variation-tolerant circuits: circuit solutions and techniques (JT, KAB, VD), pp. 762–763.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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