Travelled to:
1 × France
10 × USA
2 × Germany
Collaborated with:
J.Tschanz S.Borkar T.Karnik K.A.Bowman Y.Ye K.Roy L.Wei ∅ Z.Chen G.Sery P.Pant A.Chatterjee M.M.Khellah S.M.Burns A.Keshavarzi S.Narendra N.Azizi F.N.Najm S.Lu W.Zhang M.T.Kandemir N.Vijaykrishnan M.J.Irwin D.Somasekhar S.H.Choi M.Johnson M.Ketkar N.Menezes C.Wilkerson S.Y.Borkar V.Govindarajulu A.Vassighi G.Schrom S.Lee G.Chrysler M.Sachdev M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian C.Tokunaga A.Raychowdhury J.Kulkarni D.Avresky
Talks about:
circuit (8) design (8) cmos (6) variat (4) power (4) optim (4) low (4) techniqu (3) voltag (3) microprocessor (2)
Person: Vivek De
DBLP: De:Vivek
Contributed to:
Wrote 16 papers:
- DATE-2013-De #design
- Near-threshold voltage design in nanoscale CMOS (VD), p. 612.
- DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
- Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
- DAC-2009-BowmanTWLKDB
- Circuit techniques for dynamic variation tolerance (KAB, JT, CW, SLL, TK, VD, SYB), pp. 4–7.
- DAC-2007-BurnsKMBTD #analysis #comparative #design #statistics
- Comparative Analysis of Conventional and Statistical Design Techniques (SMB, MK, NM, KAB, JT, VD), pp. 238–243.
- DAC-2005-AziziKDN #design #power management #scalability
- Variations-aware low-power design with voltage scaling (NA, MMK, VD, FNN), pp. 529–534.
- DAC-2005-TschanzBD
- Variation-tolerant circuits: circuit solutions and techniques (JT, KAB, VD), pp. 762–763.
- DAC-2004-BorkarKD #challenge #design #reliability
- Design and reliability challenges in nanometer technologies (SB, TK, VD), p. 75.
- DAC-2004-VassighiKNSYLCSD #design #optimisation
- Design optimizations for microprocessors at low temperature (AV, AK, SN, GS, YY, SL, GC, MS, VD), pp. 2–5.
- DAC-2003-BorkarKNTKD #architecture #parametricity
- Parameter variations and impact on circuits and microarchitecture (SB, TK, SN, JT, AK, VD), pp. 338–342.
- DATE-2003-ZhangKVID #compilation #energy
- Compiler Support for Reducing Leakage Energy Consumption (WZ, MTK, NV, MJI, VD), pp. 11146–11147.
- DAC-2002-KarnikYTWBGDB #optimisation #performance
- Total power optimization by simultaneous dual-Vt allocation and device sizing in high performance microprocessors (TK, YY, JT, LW, SMB, VG, VD, SB), pp. 486–491.
- DAC-2002-SeryBD #question #why
- Life is CMOS: why chase the life after? (GS, SB, VD), pp. 78–83.
- DAC-2000-SomasekharCRYD #analysis
- Dynamic noise analysis in precharge-evaluate circuits (DS, SHC, KR, YY, VD), p. 243.
- DAC-1999-WeiCRYD #design #power management
- Mixed-Vth (MVT) CMOS Circuit Design Methodology for Low Power Applications (LW, ZC, KR, YY, VD), pp. 430–435.
- DAC-1998-WeiCJRD #design #optimisation #performance
- Design and Optimization of Low Voltage High Performance Dual Threshold CMOS Circuits (LW, ZC, MJ, KR, VD), pp. 489–494.
- DAC-1997-PantDC #energy #logic #network #optimisation #power management #random
- Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks (PP, VD, AC), pp. 403–408.