Travelled to:1 × Germany
1 × USA
Collaborated with:V.De N.Azizi F.N.Najm M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian T.Karnik K.A.Bowman J.Tschanz S.Lu C.Tokunaga A.Raychowdhury J.Kulkarni D.Avresky
Talks about:design (2) reliabl (1) voltag (1) variat (1) ultim (1) scale (1) power (1) test (1) cmos (1) awar (1)
Person: Muhammad M. Khellah
DBLP: Khellah:Muhammad_M=
Contributed to:
2012
2005Wrote 2 papers:
- DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
- Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
- DAC-2005-AziziKDN #design #power management #scalability
- Variations-aware low-power design with voltage scaling (NA, MMK, VD, FNN), pp. 529–534.