Travelled to:
1 × Germany
Collaborated with:
M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian T.Karnik K.A.Bowman J.Tschanz S.Lu A.Raychowdhury M.M.Khellah J.Kulkarni V.De D.Avresky
Talks about:
reliabl (1) design (1) ultim (1) test (1) cmos (1)
Person: Carlos Tokunaga
DBLP: Tokunaga:Carlos
Contributed to:
Wrote 1 papers:
- DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
- Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.