Travelled to:1 × Canada
2 × Germany
4 × France
Collaborated with:M.Lubaszewski L.Carro A.Vieira P.Faustini ∅ B.Courtois A.Orailoglu M.Renovell F.Azaïs Y.Bertrand
Talks about:softwar (4) test (3) problem (2) metric (2) analog (2) estim (2) embed (2) use (2) microsystem (1) capacitor (1)
Person: Érika F. Cota
DBLP: Cota:=Eacute=rika_F=
Contributed to:
2015
201420102002200019991998Wrote 7 papers:
- DATE-2015-VieiraFCC #estimation #metric
- NFRs early estimation through software metrics (AV, PF, LC, ÉFC), pp. 329–332.
- ICSME-2014-VieiraFC #embedded #maintenance #metric #performance #using
- Using Software Metrics to Estimate the Impact of Maintenance in the Performance of Embedded Software (AV, PF, ÉFC), pp. 521–525.
- DATE-2010-Cota #embedded #problem #question #testing #what
- Embedded software testing: What kind of problem is this? (ÉFC), p. 1486.
- DATE-2002-CotaCLO #design #testing
- Test Planning and Design Space Exploration in a Core-Based Environment (ÉFC, LC, ML, AO), pp. 478–485.
- DATE-2000-CotaRABCL #reuse
- Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte (ÉFC, MR, FA, YB, LC, ML), pp. 226–230.
- DATE-1999-CotaCL #adaptation #fault #linear #using
- A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester (ÉFC, LC, ML), pp. 184–188.
- DATE-1998-LubaszewskiCC #approach #problem #testing
- Microsystems Testing: an Approach and Open Problems (ML, ÉFC, BC), pp. 524–528.