Travelled to:1 × Italy
2 × Germany
3 × France
3 × USA
Collaborated with:R.Drechsler J.Malburg A.Finder A.Sülflow M.Dehbashi ∅ H.Riener S.Frehse D.Große S.Safarpour A.G.Veneris K.Winkelmann H.Trylus D.Stoffel R.Aitken Z.T.Kalbarczyk F.Reichenbach M.S.Reorda C.Braunstein U.Kühne F.Rogin T.Klotz S.Rülke
Talks about:base (5) hardwar (3) analysi (3) design (3) understand (2) generat (2) automat (2) formal (2) verif (2) toler (2)
Person: Görschwin Fey
DBLP: Fey:G=ouml=rschwin
Contributed to:
2014
2013
201220112009200920082006
20062004Wrote 13 papers:
- PDP-2014-DehbashiF #debugging #multi #online #transaction
- Transaction-Based Online Debug for NoC-Based Multiprocessor SoCs (MD, GF), pp. 400–404.
- DATE-2013-AitkenFKRR #analysis #how #question #reliability
- Reliability analysis reloaded: how will we survive? (RA, GF, ZTK, FR, MSR), pp. 358–367.
- DATE-2013-MalburgFF #analysis #comprehension #data flow #design
- Tuning dynamic data flow analysis to support design understanding (JM, AF, GF), pp. 1179–1184.
- DATE-2013-RienerFF #fault tolerance
- Improving fault tolerance utilizing hardware-software-co-synthesis (HR, SF, GF), pp. 939–942.
- DAC-2012-MalburgFF #automation #design #hardware #locality #metric #using
- Automated feature localization for hardware designs using coverage metrics (JM, AF, GF), pp. 941–946.
- DAC-2011-Fey #analysis #data flow #multi
- Orchestrated multi-level information flow analysis to understand SoCs (GF), pp. 284–285.
- DAC-2009-FeySD #bound #fault tolerance #using
- Computing bounds for fault tolerance using formal techniques (GF, AS, RD), pp. 190–195.
- DATE-2009-SulflowFBKD #debugging #satisfiability
- Increasing the accuracy of SAT-based debugging (AS, GF, CB, UK, RD), pp. 1326–1331.
- DATE-2008-RoginKFDR #automation #design #generative #hardware
- Automatic Generation of Complex Properties for Hardware Designs (FR, TK, GF, RD, SR), pp. 545–548.
- DATE-2006-FeyGD #verification
- Avoiding false negatives in formal verification for protocol-driven blocks (GF, DG, RD), pp. 1225–1226.
- DATE-2006-FeySVD #on the #satisfiability
- On the relation between simulation-based and SAT-based diagnosis (GF, SS, AGV, RD), pp. 1139–1144.
- SFM-2006-DrechslerF #automation #generative
- Automatic Test Pattern Generation (RD, GF), pp. 30–55.
- DATE-v1-2004-WinkelmannTSF #low cost #verification
- Cost-Efficient Block Verification for a UMTS Up-Link Chip-Rate Coprocessor (KW, HJT, DS, GF), pp. 162–167.