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Travelled to:
1 × France
10 × USA
2 × Germany
Collaborated with:
J.Tschanz S.Borkar T.Karnik K.A.Bowman Y.Ye K.Roy L.Wei Z.Chen G.Sery P.Pant A.Chatterjee M.M.Khellah S.M.Burns A.Keshavarzi S.Narendra N.Azizi F.N.Najm S.Lu W.Zhang M.T.Kandemir N.Vijaykrishnan M.J.Irwin D.Somasekhar S.H.Choi M.Johnson M.Ketkar N.Menezes C.Wilkerson S.Y.Borkar V.Govindarajulu A.Vassighi G.Schrom S.Lee G.Chrysler M.Sachdev M.Nicolaidis L.Anghel N.Zergainoh Y.Zorian C.Tokunaga A.Raychowdhury J.Kulkarni D.Avresky
Talks about:
circuit (8) design (8) cmos (6) variat (4) power (4) optim (4) low (4) techniqu (3) voltag (3) microprocessor (2)

Person: Vivek De

DBLP DBLP: De:Vivek

Contributed to:

DATE 20132013
DATE 20122012
DAC 20092009
DAC 20072007
DAC 20052005
DAC 20042004
DAC 20032003
DATE 20032003
DAC 20022002
DAC 20002000
DAC 19991999
DAC 19981998
DAC 19971997

Wrote 16 papers:

DATE-2013-De #design
Near-threshold voltage design in nanoscale CMOS (VD), p. 612.
DATE-2012-NicolaidisAZZKBTLTRKKDA #design #reliability
Design for test and reliability in ultimate CMOS (MN, LA, NEZ, YZ, TK, KAB, JT, SLL, CT, AR, MMK, JK, VD, DA), pp. 677–682.
DAC-2009-BowmanTWLKDB
Circuit techniques for dynamic variation tolerance (KAB, JT, CW, SLL, TK, VD, SYB), pp. 4–7.
DAC-2007-BurnsKMBTD #analysis #comparative #design #statistics
Comparative Analysis of Conventional and Statistical Design Techniques (SMB, MK, NM, KAB, JT, VD), pp. 238–243.
DAC-2005-AziziKDN #design #power management #scalability
Variations-aware low-power design with voltage scaling (NA, MMK, VD, FNN), pp. 529–534.
DAC-2005-TschanzBD
Variation-tolerant circuits: circuit solutions and techniques (JT, KAB, VD), pp. 762–763.
DAC-2004-BorkarKD #challenge #design #reliability
Design and reliability challenges in nanometer technologies (SB, TK, VD), p. 75.
DAC-2004-VassighiKNSYLCSD #design #optimisation
Design optimizations for microprocessors at low temperature (AV, AK, SN, GS, YY, SL, GC, MS, VD), pp. 2–5.
DAC-2003-BorkarKNTKD #architecture #parametricity
Parameter variations and impact on circuits and microarchitecture (SB, TK, SN, JT, AK, VD), pp. 338–342.
DATE-2003-ZhangKVID #compilation #energy
Compiler Support for Reducing Leakage Energy Consumption (WZ, MTK, NV, MJI, VD), pp. 11146–11147.
DAC-2002-KarnikYTWBGDB #optimisation #performance
Total power optimization by simultaneous dual-Vt allocation and device sizing in high performance microprocessors (TK, YY, JT, LW, SMB, VG, VD, SB), pp. 486–491.
DAC-2002-SeryBD #question #why
Life is CMOS: why chase the life after? (GS, SB, VD), pp. 78–83.
DAC-2000-SomasekharCRYD #analysis
Dynamic noise analysis in precharge-evaluate circuits (DS, SHC, KR, YY, VD), p. 243.
DAC-1999-WeiCRYD #design #power management
Mixed-Vth (MVT) CMOS Circuit Design Methodology for Low Power Applications (LW, ZC, KR, YY, VD), pp. 430–435.
DAC-1998-WeiCJRD #design #optimisation #performance
Design and Optimization of Low Voltage High Performance Dual Threshold CMOS Circuits (LW, ZC, MJ, KR, VD), pp. 489–494.
DAC-1997-PantDC #energy #logic #network #optimisation #power management #random
Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks (PP, VD, AC), pp. 403–408.

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