Travelled to:
2 × France
3 × USA
4 × Germany
Collaborated with:
L.Lavagno Y.Watanabe F.Gregoretti A.L.Rosa A.L.Sangiovanni-Vincentelli V.Shah G.Cabodi P.Camurati S.Quer M.Chiodo G.Arrigoni L.Duchini T.Cuatto A.Jurecska A.Damiano C.Sansoè J.Cortadella A.Kondratyev M.Massot S.Moral
Talks about:
schedul (4) softwar (3) design (3) time (3) reconfigur (2) hardwar (2) generat (2) control (2) system (2) simul (2)
Person: Claudio Passerone
DBLP: Passerone:Claudio
Contributed to:
Wrote 10 papers:
- DATE-2005-LavagnoPSW #design #slicing
- A Time Slice Based Scheduler Model for System Level Design (LL, CP, VS, YW), pp. 378–383.
- DATE-v2-2004-RosaPGL #configuration management #framework #implementation
- Implementation of a UMTS Turbo-Decoder on a Dynamically Reconfigurable Platform (ALR, CP, FG, LL), pp. 1218–1223.
- DATE-2003-RosaLP #configuration management #design #hardware
- Hardware/Software Design Space Exploration for a Reconfigurable Processor (ALR, LL, CP), pp. 10570–10575.
- DATE-2002-ArrigoniDPLW #scheduling
- False Path Elimination in Quasi-Static Scheduling (GA, LD, CP, LL, YW), pp. 964–970.
- DATE-2001-PasseroneWL #generative #graph #scheduling
- Generation of minimal size code for scheduling graphs (CP, YW, LL), pp. 668–673.
- DAC-2000-CortadellaKLMMPWS #embedded #generative #scheduling
- Task generation and compile-time scheduling for mixed data-control embedded software (JC, AK, LL, MM, SM, CP, YW, ALSV), pp. 489–494.
- DATE-1999-CabodiCPQ #simulation
- Computing Timed Transition Relations for Sequential Cycle-Based Simulation (GC, PC, CP, SQ), pp. 8–12.
- DAC-1998-CuattoPLJDSS #case study #design #embedded
- A Case Study in Embedded System Design: An Engine Control Unit (TC, CP, LL, AJ, AD, CS, ALSV), pp. 804–807.
- DAC-1997-PasseroneLCS #analysis #hardware #performance #prototype #trade-off
- Fast Hardware/Software Co-Simulation for Virtual Prototyping and Trade-Off Analysis (CP, LL, MC, ALSV), pp. 389–394.
- PDP-1995-GregorettiP #architecture #parallel #testing #using
- Using a massively parallel architecture for integrated circuits testing (FG, CP), pp. 332–338.