Travelled to:1 × Canada
1 × USA
4 × France
5 × Germany
Collaborated with:J.Mathew C.Liu A.M.Jabir S.Subbarayan R.A.Shafik J.Singh Z.Link K.Chakrabarty S.M.Reddy W.Kunz M.Hosseinabady M.R.Kakoee S.Banerjee R.K.Roy S.T.Chakradhar L.Sun Z.Li Y.Yang M.Ottavi S.Pontarelli X.Huang S.Bhattacharjee A.J.Ricketts K.Ramakrishnan N.Vijaykrishnan S.Hollis S.P.Mohanty
Talks about:power (4) test (4) low (3) switch (2) novel (2) graph (2) sram (2) base (2) complementari (1) architectur (1)
Person: Dhiraj K. Pradhan
DBLP: Pradhan:Dhiraj_K=
Contributed to:
2014201320102009200820062004
20052003
19951994Wrote 12 papers:
- DATE-2014-SunMSPL #design #power management #robust
- A low power and robust carbon nanotube 6T SRAM design with metallic tolerance (LS, JM, RAS, DKP, ZL), pp. 1–4.
- DATE-2014-YangMPOP #logic #using
- Complementary resistive switch based stateful logic operations using material implication (YY, JM, DKP, MO, SP), pp. 1–4.
- DATE-2013-HuangMSBP #effectiveness #performance
- A fast and Effective DFT for test and diagnosis of power switches in SoCs (XH, JM, RAS, SB, DKP), pp. 1089–1092.
- DATE-2010-RickettsSRVP #power management
- Investigating the impact of NBTI on different power saving cache strategies (AJR, JS, KR, NV, DKP), pp. 592–597.
- DATE-2009-SinghPHMM #embedded #power management
- Single ended 6T SRAM with isolated read-port for low-power embedded systems (JS, DKP, SH, SPM, JM), pp. 917–922.
- DATE-2008-HosseinabadyKMP #architecture #energy #graph #latency #performance #scalability
- De Bruijn Graph as a Low Latency Scalable Architecture for Energy Efficient Massive NoCs (MH, MRK, JM, DKP), pp. 1370–1373.
- DATE-2006-LiuLP #scheduling
- Reuse-based test access and integrated test scheduling for network-on-chip (CL, ZL, DKP), pp. 303–308.
- DATE-v2-2004-JabirP #diagrams #multi #named #representation
- MODD: A New Decision Diagram and Representation for Multiple Output Binary Functions (AMJ, DKP), pp. 1388–1389.
- SAT-J-2004-SubbarayanP05 #named #preprocessor #satisfiability
- NiVER: Non-increasing Variable Elimination Resolution for Preprocessing SAT Instances (SS, DKP), pp. 276–291.
- DATE-2003-PradhanLC #detection #fault #generative #named #novel
- EBIST: A Novel Test Generator with Built-In Fault Detection Capability (DKP, CL, KC), pp. 10224–10229.
- DAC-1995-ReddyKP #framework #novel #synthesis #verification
- Novel Verification Framework Combining Structural and OBDD Methods in a Synthesis Environment (SMR, WK, DKP), pp. 414–419.
- EDAC-1994-BanerjeeRCP #graph transformation
- Signal Transition Graph Transformations for Initializability (SB, RKR, STC, DKP), p. 670.