Travelled to:
1 × USA
5 × France
5 × Germany
Collaborated with:
C.A.Papachristou B.S.Gill B.P.Singh D.J.Weyer D.R.McIntyre A.Shankar S.Bhunia S.Clay H.Rizk R.S.Chakraborty M.Nicolaidis S.L.Garverick M.J.Knieser M.S.Hashemian X.Wang S.Narasimhan A.R.Krishna S.Rajgopal T.Lee M.Mehregany
Talks about:
analysi (4) design (3) soft (3) compress (2) specif (2) detect (2) error (2) test (2) high (2) use (2)
Person: Francis G. Wolff
DBLP: Wolff:Francis_G=
Contributed to:
Wrote 11 papers:
- DATE-2015-HashemianSWWCP #array #authentication #robust #using
- A robust authentication methodology using physically unclonable functions in DRAM arrays (MSH, BPS, FGW, DJW, SC, CAP), pp. 647–652.
- DAC-2014-ShankarSWP #analysis #concept #design #specification
- Ontology-guided Conceptual Analysis of Design Specifications (AS, BPS, FGW, CAP), p. 6.
- DATE-2014-SinghSWPWC #analysis #specification
- Cross-correlation of specification and RTL for soft IP analysis (BPS, AS, FGW, CAP, DJW, SC), pp. 1–6.
- DATE-2011-WangNKWRLMB #configuration management #using
- High-temperature (>500°C) reconfigurable computing using silicon carbide NEMS switches (XW, SN, ARK, FGW, SR, THL, MM, SB), pp. 1065–1070.
- DATE-2008-WolffPBC #analysis #detection #problem #towards
- Towards Trojan-Free Trusted ICs: Problem Analysis and Detection Scheme (FGW, CAP, SB, RSC), pp. 1362–1365.
- DATE-2007-GillPW #fault #interactive #power management #symmetry
- Interactive presentation: A new asymmetric SRAM cell to reduce soft errors and leakage power in FPGA (BSG, CAP, FGW), pp. 1460–1465.
- DATE-2006-GillPW #analysis #fault #logic
- Soft delay error analysis in logic circuits (BSG, CAP, FGW), pp. 47–52.
- DATE-2005-GillNWPG #design #detection #performance
- An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories (BSG, MN, FGW, CAP, SLG), pp. 592–597.
- DATE-v1-2004-WolffPM #hardware
- Test Compression and Hardware Decompression for Scan-Based SoCs (FGW, CAP, DRM), pp. 716–717.
- DATE-v2-2004-RizkPW #design #embedded #source code
- Designing Self Test Programs for Embedded DSP Cores (HR, CAP, FGW), pp. 816–823.
- DATE-2003-KnieserWPWM
- A Technique for High Ratio LZW Compression (MJK, FGW, CAP, DJW, DRM), pp. 10116–10121.