Travelled to:
1 × Germany
12 × USA
Collaborated with:
M.A.Breuer D.T.Miller P.R.Menon E.M.Rudnick P.S.Parikh ∅ C.E.Stroud M.Emmert X.Yu J.T.d.Sousa D.G.Saab M.A.Iyer D.E.Long K.B.Rajan Y.H.Levendel K.Kumar Y.Santoso M.C.Merten P.Bradley K.N.Dwarakanath P.Levin G.Memmi D.Miller A.Nahir A.Ziv R.Galivanche A.J.Hu A.Camilleri B.Bentley H.Foster V.Bertacco S.Kapoor
Talks about:
sequenti (3) simul (3) fault (3) test (3) use (3) reconfigur (2) approach (2) silicon (2) freez (2) clock (2)
Person: Miron Abramovici
DBLP: Abramovici:Miron
Contributed to:
Wrote 14 papers:
- DAC-2010-NahirZGHACBFBK #validation #verification
- Bridging pre-silicon verification and post-silicon validation (AN, AZ, RG, AJH, MA, AC, BB, HF, VB, SK), pp. 94–95.
- DAC-2006-AbramoviciBDLMM #configuration management #framework
- A reconfigurable design-for-debug infrastructure for SoCs (MA, PB, KND, PL, GM, DM), pp. 7–12.
- DAC-2002-AbramoviciSE #embedded #using
- Using embedded FPGAs for SoC yield improvement (MA, CES, ME), pp. 713–724.
- DAC-2002-AbramoviciYR #low cost
- Low-cost sequential ATPG with clock-control DFT (MA, XY, EMR), pp. 243–248.
- DAC-1999-AbramoviciSS #configuration management #hardware #satisfiability #using
- A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware (MA, JTdS, DGS), pp. 684–690.
- DATE-1999-SantosoMRA #generative #named #testing #using
- FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy (YS, MCM, EMR, MA), p. 747–?.
- DAC-1996-IyerLA #identification
- Identifying Sequential Redundancies Without Search (MAI, DEL, MA), pp. 457–462.
- DAC-1993-ParikhA #approach #cost analysis
- A Cost-Based Approach to Partial Scan (PSP, MA), pp. 255–259.
- DAC-1992-AbramoviciRM #approach #exclamation #testing
- Freeze!: A New Approach for Testing Sequential Circuits (MA, KBR, DTM), pp. 22–25.
- DAC-1983-AbramoviciMM #fault #simulation
- Critical path tracing — an alternative to fault simulation (MA, PRM, DTM), pp. 214–220.
- DAC-1982-AbramoviciLM #logic #simulation
- A logic simulation machine (MA, YHL, PRM), pp. 65–73.
- DAC-1981-Abramovici #algorithm #testing
- A maximal resolution guided-probe testing algorithm (MA), pp. 189–195.
- DAC-1980-AbramoviciB #analysis #fault
- Fault diagnosis based on effect-cause analysis: An introduction (MA, MAB), pp. 69–76.
- DAC-1977-AbramoviciBK #concurrent #fault #functional #modelling #simulation
- Concurrent fault simulation and functional level modeling (MA, MAB, KK), pp. 128–137.